Work with the DFT and Chip Architects to define DFT strategy, methodologies, and implementation plan for various projects (chip_level and stand-alone IP blocks such as PHYs and chiplets)
Implement DFT features in RTL for digital and analog blocks to the defined architecture & plan
Generate patterns (e.g., 1687 PLDs, 1149.x, MBIST, etc.) and validate the same at the RTL & gate level
Generate ATPG patterns (SA/TDF/etc.) and validate the same in 0-delay and SDF-delay based simulations.
Collaborate with Analog/Mixed Signal (AMS) teams to ensure DFT coverage for high-speed interfaces & implement structural tests for digital logic in the analog blocks
Work with circuit architects on advanced testing techniques such as PRBS-based PHY loopback capabilities, internal measurement of high-speed clock networks, etc.
Support flow automation and scripting
Support device bring up in the lab and pattern handoff to operations for high volume manufacturing and qualification (e.g., running patterns in the lab via the TAP controller, post-silicon bring up of patterns on the ATE, pattern bring up for HTOL and other QUAL activities, RMA analysis, etc.)
Document overall test coverage and mitigation strategy to narrow down holes
Proficient in modern DFT/DFx techniques, methods, & tools (scan insert & ATPG, MBIST, etc.)
Working knowledge of relevant industry standards (e.g., IEEE 1149.x/1687/1500/1838)
Proficient in Verilog simulation & debug of DFT structures at the RTL & gate level
General knowledge of digital and AMS circuit design techniques
Experience in taping out at least 4 designs and bring up of at least 2 designs on an ATE or in the lab
Proficient in TCL/shell scripting, working knowledge of scripting in one of perl/python or similar languages, working knowledge of other industry standard tools (Make, bug tracking, colab SW)
Ability to work collaboratively with cross functional team
BS EE or equivalent, with 6-9 years of experience
Deep expertise in modern test methods and DFx methodologies
Experience in balancing tradeoffs of test time vs complexity (PPA) vs coverage
Experience in taking a holistic view of a devices test coverage to incorporate the coverage from non-structural tests into the overall coverage analysis
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