Device Characterization Engineer

onsemi is seeking a highly motivated Semiconductor Device Characterization Engineer at Hopewell Junctions, New York. to support high-volume manufacturing and new technology development activities.

Expertise in trench MOSFET and/or IGBT is desired.

This role serves as a critical technical resource for electrical characterization, data analysis, process evaluation, and manufacturing decision support during non-standard operating hours, providing rapid response to production and quality issues.

The successful candidate will leverage device physics knowledge, statistical analysis, and electrical characterization expertise to evaluate product performance, disposition manufacturing holds, assess process changes, and drive timely technical decisions that maintain product quality and manufacturing continuity.

• Electrical characterization activities for trench MOSFET, IGBT, and related power semiconductor technologies.
• Analyze parametric, probe, final test, reliability, and failure analysis data to identify trends, excursions, and process-induced performance shifts.
• Provide technical assessment and disposition recommendations for manufacturing lot holds, process deviations, and electrical outliers.
• Serve as the primary engineering resource for rapid investigation of production issues requiring immediate technical evaluation.
• Evaluate the impact of process changes, equipment modifications, material changes, and process excursions on device performance and reliability.
• Develop and execute characterization plans to support process qualification, technology transfers, and continuous improvement initiatives.
• Correlate wafer sort, package test, reliability, and device characterization data to determine root causes of electrical performance variations.
• Collaborate with process integration, device engineering, yield engineering, quality, reliability, test engineering, and manufacturing teams to resolve issues and drive corrective actions.
• Perform statistical analysis using large datasets to identify yield detractors and opportunities for process optimization.
• Actively monitor and react to key device parameters
• Generate concise technical reports and communicate findings, risks, and recommendations to management and cross-functional teams.